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2025 February Issue: MEMS/NEMS for Biosensing

 

  • The Editors’ Desk [The Editors’ Desk]”

Bing J. Sheu, Chang Gung University, Taiwan;

Shao-Ku Kao, Chang Gung University, Taiwan.

 

  • “Multi-Physics Models and Simulation [Guest Editorial]”

Jianlong Ji, Taiyuan University of Technology, China;

Nan Xiang, Southeast University, China.

  • Recent Advances of Signal Acquisition Approaches for Microfluidic Impedance Flow Cytometry

Shanshan Li, Hebei University of Technology, China;

Sheng Pang, Hebei University of Technology, China;

Ruohan Li, Hebei University of Technology, China;

Junwei Li, Hebei University of Technology, China.

 

  • Microscale Electrical Impedance Tomography Method for Cell Phase Separation Detection

Jinming Liang, Nanjing University of Aeronautics and Astronautics, China;

Bihan Gao, Nanjing University of Aeronautics and Astronautics, China;

Kai Liu, Nanjing University of Aeronautics and Astronautics, China;

Xiaojie Chai, Taiyuan University of Technology, China;

Jianlong Ji, Taiyuan University of Technology, China;

Bo Sun, Xi’an University of Technology, China;

Jiafeng Yao, Nanjing University of Aeronautics and Astronautics, China.

 

  • Bimodal Fusion of Single-cell Impedance and Imaging Data Using Five Deep Neural Networks

Songjiang Chen, University of Chinese Academy of Sciences, China;

Xiao Chen, University of Chinese Academy of Sciences, China;

Xukun Huang, University of Chinese Academy of Sciences, China;

Zhen Fang, University of Chinese Academy of Sciences, China;

Junbo Wang, University of Chinese Academy of Sciences, China;

Xiaoye Huo, University of Chinese Academy of Sciences, China;

Xianxiang Chen, University of Chinese Academy of Sciences, China;

Jian Chen, University of Chinese Academy of Sciences, China.

 

  • Operating Conversational Large Language Models (LLMs) in the Presence of Errors

Zhen Gao, Tianjin University, China;

Jie Deng, Tianjin University, China;  

Pedro Reviriego, Universidad Politécnica de Madrid, Spain;

Shanshan Liu, University of Electronic Science and Technology of China, China;

Alejando Pozo, Universidad Politécnica de Madrid, Spain;

Fabrizio Lombardi, Northeastern University, USA.