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2. 2021 February Issue: Nanometrology and Nanocharacterization

2021 February Issue: Nanometrology and Nanocharacterization

• “Measuring and Characterizing Nanotechnology [The Editors’ Desk]”

Bing Sheu, Chang Gung University, Taiwan;

Xiaoning Jiang, North Carolina State University, USA.

 

• “Nanometrology and Nanocharacterization [Guest Editorial]”

Guangyong Li, University of Pittsburgh, USA;

Zuobin Wang, Changchun University of Science and Technology, China.

 

• “Selective Anticancer Effect of Phellinus Linteus on Epidermoid Cell Lines Studied by Atomic Force Microscopy”

Mingyan Gao, Changchun University of Science and Technology, China;

Yuxi Huang, Changchun University of Science and Technology, China;

Cuihua Hu, Changchun University of Science and Technology, China;

Jing Hu, Changchun University of Science and Technology, China;

Ying Wang, Changchun University of Science and Technology, China;

Yujuan Chen, Changchun University of Science and Technology, China;

Yibing Huang, Jilin University, China;

Guicai Song, Changchun University of Science and Technology, China;

Zhengxun Song, Changchun University of Science and Technology, China;

Zuobin Wang, Changchun University of Science and Technology, China.

 

• “Advances in Scanning Ion Conductance Microscopy”

Peng Li, Beijing University of Technology, China;

Guangyong Li, University of Pittsburgh, USA.

 

• “Transmission Electron Microscopy”

Susheng Tan, University of Pittsburgh, USA.

 

• “Advances in Dielectric Microspherical Lens Nanoscopy”

Pan Li, Hohai University, China;

Guangyong Li, University of Pittsburgh, USA;

Haibo Yu, Chinese Academy of Sciences, China;

Feifei Wang, Stanford University, USA;

Lianqing Liu, Chinese Academy of Sciences, China;

Wen Jung Li, City University of Hong Kong, China.